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Polytec is addressing the surface metrology market with innovative, high-precision 3-D profilometer technology that works on rough, smooth and stepped surfaces without contact. These products are based on scanning white-light interferometry, also called coherent or vertical scanning interferometry or coherence radar. With their large vertical range and nanometer resolution, they are ideal tools for determining flatness, height differences and parallelism of large surfaces and structures, including soft materials.
Advance Profilometer - TMS-1200
With its high spatial resolution, the TMS-1200 TopMap µ.Lab measurement microscope sets new standards in non contact-topography measurement.
Simple, quick and precise, it acquires high-resolution topographical maps of functional surfaces and microstructures to determine critical parameters such as flatness, ripple and roughness.
3-D Profilometer for Surface
The TMS-500 TopMap is a high-precision, non-contact topography measurement system designed for fast and efficient surface characterization of precision mechanical components.
Business Park Kebon JerukBlok F2 No. 9Jl. Raya Meruya Ilir No. 88Meruya UtaraJakarta 11620Tel. +62 21 5859365Fax. +62 21 5859268www.dynatech-int.com
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