Scanning Electron Microscope provide the best solution for your
topographic and surface analysis tools. Tescan brings
the top level technical solutions in the branch of electron microscopy.
Scanning Electron Microscope provide the best solution for your topographic and surface analysis tools.Tescan brings the top level technical solutions in the branch of electron microscopy and through the satisfied customers' public to keep holding its position among the leading groups and companies in the field of electron microscopy. SEM cover wide range of applications from nanotechnology, electronic & semiconductor, biomedical application, crystalline structure, powder technology, forensic, coating technology, metallographic solution,mineralogy to agriculture and veterinary.TESCAN provides both Tungsten electrode SEM and Field Emission SEM (FE-SEM).
With the new four optics configuration TESCAN SEM has four modes of viewing, They are 'Fish-eye' mode provides a macro view of the sample, 'Field' mode optimizes the column to provide an extra large field of view, 'Depth' mode sets the column up in a mode, which enhances the depth of focus, 'Resolution' mode automatically configures the column to produce the highest resolution for the chosen working conditions.

SEM Accessories and configuration that can be attached:
- Variable Vacuum option
- Low Vacuum Secondary Tescan Detector (LVSTD)
- Transmitted Electron (TE) detector
- Electron Beam Induced Current (EBIC)
- Engery Dispersive X-ray Fluorescence Spectrometer (EDXS)
- Wavelength Dispersive X-ray Fluorescence Spectrometer (WDXS)
- Electron Back-Scattered Diffraction (EBSD)
- Cooling stage with Peltier Couple
